|12:00pm-7:00pm||Exhibits Open (when not in session)|
|10:30 – 10:45 a.m.||Break|
(Select 1 of the 3 Tutorials only ** Tutorials an additional fee to conference registration during checkout)
|Pre-Conference Tutorials Run 9am-12pm the first morning. You may select one of the Tutorials only: Evolution of High Density Packaging; Fan Out Packaging Evolution & Complexity; OR Introduction to Solder Flip Chip with an Emphasis on Cu Pillar. Tutorials are available for an additional fee from the regular conference registration. Descriptions of the courses are below, and you may select a tutorial during CHECKOUT (on the “sessions” page).
PRE-CONFERENCE TUTORIAL – Option 1:
The Evolution of High Density Packaging
**THIS TUTORIAL IS 2-HOURS – 9am-11am**
1. Microelectronic Packaging Platforms
2. Microelectronics Market & Business Considerations
3. Where is Packaging Technology Going
Phil Garrou, Microelectronic Consultants of NC | Dr. Philip Garrou retired from Dow Chemical in 2004 as Global Director of Technology for their Advanced Electronic Materials business unit. He is now contributing editor and blogger (“Insights from the Leading Edge”) for Solid State Technology , a subject matter expert (SME) for DARPA and runs his consulting company Microelectronic Consultants of NC in the RTP area.
|PRE-CONFERENCE TUTORIAL – Option 2:
Fan Out Packaging Evolution & Complexity
With the ubiquitous use of a wide variety of mobile devices, along with the rise of the Internet of Things, the Electronics industry has been driven by the need for a continual reduction in the thickness and physical volume of semiconductor packaging. Fan Out technology has evolved as an alternative package to answer this need for miniaturization of electronics, while also providing improved electrical interconnectivity.
At the same time, the wide use of mobile devices and the newer IOTs has driven the need for increased capability of data centers, and Fan Out technology is finding value in the heterogeneous integration of die and memory with improved electrical performance, with lower cost than traditional 2.5 packaging for these data center requirements.
We will review how the integration of wafer level processing technologies; substrate evolution and Flip Chip packaging structures have come together into what is being called Fan Out Packaging. These packages are for both low density and high density, Mobile and server applications. They have higher levels of integration and sophistication than has ever been possible in the past. An overview of the concept of Fan Out packaging, a history of its evolution, both low end and high end applications, and market trends will be included in this course.
John Hunt, ASE US, Inc. | John is Senior Director, Engineering, Technical Promotion, at ASE US Inc., and provides technical support for the Introduction, Engineering, Marketing, and Business Development activities for Advanced Wafer Level and Fan Out Packaging Technologies at ASE.
John has more than 40 years of experience in various areas of manufacturing, assembly and testing of electronic components and systems, with emphasis on the development of new technologies and processes, with a B.S. from Rutgers and an M.S. from University of Central Florida.
|PRE-CONFERENCE TUTORIAL – Option 3:
Introduction to Solder Flip Chip with an Emphasis on Cu Pillar
*THIS COURSE WAS CANCELLED*
|12:00pm-1:00pm||Lunch (Exhibits Open)|
|1:00pm-1:15pm||Welcome & Opening Remarks – Conference Co-Chairs: Phil Garrou, Microelectronic Consultants of NC; Prof. Mitsu Koyanagi, Tohoku University; and Mark Scannell, CEA-Leti|
|SESSION 1||PLENARY SESSION – KEYNOTE:|
|1:15pm-2:00pm||World Level Packaging Concepts “Wafer, Wafer – Who’s Got The Wafer?”
Jim Walker, WLP Concepts
|SESSION 2||MICRO BUMPING AND COPPER PILLAR TECHNOLOGY
Session Chair: Alan Huffman, Micross
|2:00pm-2:20pm||Fine Pitch Cu Pillar Bond on Lead Assembly
Hyunil Bae, STATSChipPAC
|2:20pm-2:40pm||New Requirements for Productivity and Accuracy in HVM Memory Stacking
Tom Strothmann, Kulicke & Soffa Industries
|2:40pm-3:00pm||Microbump DAHI Technology for integration of Compound Semiconductors to CMOS
Augusto Gutierrez-Aitken, Northrop Grumman
|3:00pm-3:20pm||High Density Interconnect Bonding at 10 um Pitch and Below Using Non-Collapsible Microbumps
Matt Lueck, Micross
|SESSION 3||EQUIPMENT & MATERIALS
Session Chair: Markus Wimplinger, EV Group
|4:00pm-4:20pm||Advanced Materials and Interconnect Technologies for 3D Packaging
Rozalia Beica, Dow Electronic Materials
|4:20-pm-4:40pm||TSV, FOWLP, Hybrid Bonding : Review of Metrology Challenges and Solutions to Support HVM
Gilles Fresquet, Unity SC
|4:40pm-5:00pm||Equipment & Process Solutions for Heterogenous Integration
Thomas Uhrmann, EV Group
|5:00pm-5:20pm||The Evolution of Substrate Build-up and Thin Wafer Handling
Kim Yess, Brewer Science
|5:20pm-5:40pm|| From Image Sensors to Everything, A New Architecture
Javier DeLaCruz, Xperi
|5:40pm-7:00pm||WELCOME RECEPTION IN THE EXHIBIT AREA